SUPPORT - MANUALS & DOWNLOADS
CC Capture

X-Rite i1 Pro Family

 

  • Supported instruments: i1Pro, i1Pro UV, i1Pro 2

  • Modes: Spot, Scan

  • M-Condition supported: M0, M1, M2 (depending on the instrument)

  • Inspectors: Print Inspector, Instrument Inspector, Lighting Inspector

  • Soon: Color Inspector, Substrate Inspector, Plate Inspector

 

Features / unique benefits:

  1. Any Direction - the user may start scanning with the normal or opposite direction
  2. Bar-code support for Scanning Template selection and description.
  3. Lighting measurements

 

Basic principles:

The user has to start scanning before the first patch and end after the last one

  1. (start and end on white).
  2. When scan mode Some M-condition requires DualScan
  3. Zebra ruler is required for the scan in DualScan mode (i1Pro 2 only)

 

Recommendations:

  1. Track your instrument with Instrument Inspector Target frequently.
  2. ChromaChecker Backer is strongly recommended - Errors caused by improper backing might be more than ∆E00=2 (Standard Proofing Paper)
  3. Calibration Standard (ceramic plaque), as well as optical path, have to be cleaned
  4. Launch X-Rite i1Diagnostic (free utility) to check Instrument and lamp restore procedure at least semi-yearly.
  5. Make sure that your USB socket delivers enough power and you are using high-quality connection cable.
  6. Be sure that environmental conditions (RHT) are in the recommended range

 

Limitation:

The limitation that comes from SDK requires to scan starting from the white area before the first patch and finish on the white area after last one.